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Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers

Authors: 
Q. Wan, R.C.Masters, D.Lidzey, K.J.Abrams, M.Dapor, R.A.Plenderleith, S. Rimmer, F.Claeyssens, C.Rodenburg
Abstract: 
Date of publication: 
15/09/2016
Published in: 
Ultramicroscopy 171 (2016) 126